Altair, ZTE collaborate on LTE testing - EE Times

Altair, ZTE collaborate on LTE testing

EE Times
Julien Happich

February 16, 2010

PARIS — Altair Semiconductor and ZTE have performed extensive system level interoperability development testing (IODT) on their respective products, Altair's recently announced FourGee LTE USB ExpressCard UE and ZTE's LTE eNodeB.
The successful testing validates the performance and maturity of the companies' LTE products, and will soon follow with a field trial to be conducted in an actual carrier network.

Altair's FourGee LTE USB ExpressCard UE is one of the industry's first Category-3 datacard solutions. Based on the company's FourGee-3100/6200 baseband/RFIC LTE chipset, the ExpressCard is a suitable test and IOT UE platform for system vendors and carriers involved in the development, trialing and deployment of LTE systems.

The FourGee LTE USB ExpressCard UE is also a reference design for terminal manufacturers working to develop commercial products based on the FourGee family of LTE chips.

The LTE USB ExpressCard UE offers category-3 speeds of 100Mbps download and 50Mbps upload, a power consumption within the USB specification power budget (below 2.5W), it comes in an ExpressCard34 form factor with a USB2.0 HS host interface and is available in select FDD/TDD bands in the range of 700 to 2700MHz.

More information on the companies and their products can be found at www.altair-semi.com or www.zte.com.cn.